The Dragonfly Test Platform is LogicVision's next generation of fully integrated embedded test solutions for manufacturing test, silicon bring-up and failure analysis of advanced SoC devices. Dragonfly delivers a comprehensive hierarchical BIST infrastructure covering memory, logic, and both regular and high-speed device I/Os. The BIST infrastructure is integrated using an advanced design automation tool flow fully compatible with all major EDA flows. Once in silicon, the BIST capabilities provide the most efficient quality versus test time trade-off of any manufacturing test methodology, enabling the most cost efficient single-digit DPM (defects-per-million) quality levels in the industry. The BIST capabilities can also be coupled with desktop or ATE-based diagnostic tools for accelerated silicon bring-up and failure analysis activities, both key in meeting shrinking product windows.
Efficient Memory BIST
The latest release of ETMemory(TM) within the Dragonfly Test Platform continues to improve an already best-in-class embedded memory test solution, delivering the most efficient memory BIST and self-repair solution in the industry. Depending on test requirements of individual memories, the new solution can implement either a very compact fixed-algorithm BIST engine or a more versatile fully programmable BIST engine. The combined enhancements deliver up to 30% reduction in area overhead. Both engine types support a self-repair option and are fully integrated into all of LogicVision's automated diagnostic and yield analysis solutions. The Dragonfly test platform also includes VHDL language support for memory BIST.
Streamlined Logic BIST
The latest release of ETLogic(TM) within the Dragonfly Test Platform delivers several new enhancements and capabilities aimed at significantly improving ease-of-adoption. These include a new and more efficient RTL rule checking engine for easy adoption by RTL designers; up to 20% area overhead reduction through simplification of scan control logic; and the capability to combine logic BIST with legacy cores that only support traditional scan based testing including support for double-capture at-speed test.
Advanced Diagnostics and Characterization
Silicon Insight(TM)-desktop provides comprehensive at-speed SoC device-level debug and characterization using a PC laptop connected to a device performance board through a USB-to-JTAG cable interface. The latest release of Silicon Insight adds support for GPIB-based bench top equipment, enabling design and test engineers to perform voltage and frequency based characterization from a laptop PC. Silicon Insight now makes it possible to perform full device debug, diagnostics and characterization without the need to access or tie-up expensive automatic test equipment.
On the production floor, Silicon Insight-ATE now adds the option to perform automated production data logging, enabling design teams and their foundry partners to analyze detailed failure and performance data. The production data log can be used with LogicVision's Yield Insight(TM) tool to identify systemic yield limiting issues and help accelerate product yield ramps.
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