LogicVision, Inc. (NASDAQ:LGVN) , a provider of test and yield learning solutions, will present at The Seventh Annual JMP Securities Research Conference in San Francisco, California. Mr. James T. Healy, LogicVision's president and CEO, and Mr. Bruce M. Jaffe, LogicVision's chief financial officer are scheduled to present on Tuesday, May 20, 2008. During the presentation, management will briefly outline its value proposition as the semiconductor world embraces testing system-on-a-chip (SoC) semiconductors from the inside and will conduct a conversation with a JMP Securities analyst about the Company's business and business climate.
Date: Tuesday, May 20, 2008
Time: 3:00 P.M. Eastern Time / 12:00 P.M. Pacific Time for the live
presentation
Location: On the web at http://investor.shareholder.com/lgvn/events.cfm
Replay: Available one hour after the presentation ends and accessible
for 90 days.
Showing posts with label yield learning. Show all posts
Showing posts with label yield learning. Show all posts
Wednesday, 14 May 2008
Saturday, 10 May 2008
About LogicVision
LogicVision (NASDAQ:LGVN) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate, works together with Silicon Insight applications and Yield Insight to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.
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