Scalable Network Technologies, Inc. (SNT), has released their new UMTS Library for the company's software products, QualNet(R) and EXata(R). QualNet and EXata are modeling and simulation/emulation software tools for predicting wireless and mixed platform network and network device performance in both controlled and real-world conditions.
The UMTS Library enables mobile network operators and equipment manufacturers to proactively address the challenges of wireless networks by quickly and accurately identifying problems - enabling faster and more efficient troubleshooting of complex networks. "What if" analysis is possible for evaluating impacts such as changes in network user demand, increased application traffic or changes in air interface configuration parameters, in a safe and repeatable synthetic environment - at extremely low cost.
The UMTS Library, built to the 3GPP7 standard, leverages the speed, scalability and high fidelity of SNT's network models to enable faster time-to-market for UMTS devices and networks. With QualNet and EXata, users can model and control the entire UMTS protocol stack on both the user and control plane level. Specific models included in the UMTS Library include HSDPA, WCDMA and 3G network components such as Mobiles, NodeB, RNC, HLR, VLR, SGSN and GGSN. Like all SNT model libraries, the UMTS Library includes full source code in C/C+ for development of proprietary algorithms and services.
Showing posts with label wireless testing. Show all posts
Showing posts with label wireless testing. Show all posts
Tuesday, 10 February 2009
Tuesday, 6 January 2009
Aehr Test Contract
Aehr Test Systems (NASDAQ:AEHR) , a supplier of semiconductor test and burn-in equipment, today announced it has received a second order for their new Advanced Burn-in and Test System (ABTS) from a leading European provider of imbedded wireless technology. The system is configured for burning-in and testing advanced logic devices.
"The technology in the ABTS is based on our successful FOX(TM)-1 full-wafer contact burn-in and test system," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "Although numerous FOX systems are currently in high volume production in many parts of the world this will be the first version of the ABTS package part burn-in and test system shipped to Europe. Other members of the ABTS family will focus on high-power logic and memory devices."
The ABTS family of products is based on a completely new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It can test and burn-in memory as well as both high-power logic and low-power logic. It can be configured to provide individual device temperature control for devices up to 50W or more and with up to 320 I/O channels. It uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.
"The technology in the ABTS is based on our successful FOX(TM)-1 full-wafer contact burn-in and test system," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "Although numerous FOX systems are currently in high volume production in many parts of the world this will be the first version of the ABTS package part burn-in and test system shipped to Europe. Other members of the ABTS family will focus on high-power logic and memory devices."
The ABTS family of products is based on a completely new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It can test and burn-in memory as well as both high-power logic and low-power logic. It can be configured to provide individual device temperature control for devices up to 50W or more and with up to 320 I/O channels. It uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.
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