LogicVision, Inc. (NASDAQ:LGVN) , a provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that it is introducing Dragonfly Test Platform(TM), the next generation of its test and diagnostic solutions. The new platform represents LogicVision's most advanced and comprehensive product portfolio. The Dragonfly Test Platform delivers the industry's most effective combination of test quality of results, ease-of-adoption, and test cost reductions specifically targeted for 65nm and 45nm system-on-chip (SoC) designs. Dragonfly also delivers new silicon diagnostics and characterization capabilities that accelerate yield ramps and enable same-day turnaround of silicon from the fab to known-good first sample shipments. The Dragonfly Test Platform will be showcased at the Design Automation Conference being held in Anaheim, California, June 9th through 12th.
"The IC market is under intense profit pressures, resulting in an increased emphasis on reducing all cost components. Reduction in cost per function is driving higher gate density, driving the growth of 65nm and 45nm design starts," said James T. Healy, President and CEO of LogicVision. "The new Dragonfly Test Platform will provide our customers with the key test, silicon bring-up and yield-ramp capabilities they need to meet rapidly increasing cost, quality, and schedule pressures."
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