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Tuesday, 6 January 2009

Aehr Test Contract

Aehr Test Systems (NASDAQ:AEHR) , a supplier of semiconductor test and burn-in equipment, today announced it has received a second order for their new Advanced Burn-in and Test System (ABTS) from a leading European provider of imbedded wireless technology. The system is configured for burning-in and testing advanced logic devices.

"The technology in the ABTS is based on our successful FOX(TM)-1 full-wafer contact burn-in and test system," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "Although numerous FOX systems are currently in high volume production in many parts of the world this will be the first version of the ABTS package part burn-in and test system shipped to Europe. Other members of the ABTS family will focus on high-power logic and memory devices."

The ABTS family of products is based on a completely new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It can test and burn-in memory as well as both high-power logic and low-power logic. It can be configured to provide individual device temperature control for devices up to 50W or more and with up to 320 I/O channels. It uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.

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